Farfield AnaLight® Systems for Surface Science and Nanotechnology
AnaLight® Systems for Surface Science bring Farfield's revolutionary Dual Polarisation Interferometry (DPI) technology into instrument formats to suit a range of surface science and thin film applications in basic research and industrial product development. The latest product in the range, the AnaLight® 4D adds has capabilities to study birefringence dynamically as these thin films are formed or stimulated range of surface science and thin film applications in basic research and industrial product development. The Workstation provides a flexible temperature range and automated sample introduction for enhanced flexibility and high productivity.
AnaLight® gives surface science, thin film and surface science structural and behavioural measurements in a convenient benchtop package:
- Dynamic, high-resolution characterisation of thin films and nanosurfaces revealing interfacial mass and structural changes in real time
- Measure film thickness, optical density (RI) and mass loading simultaneously
- Data analysis with minimal assumptions and no modelling
- Dynamic structural behaviour of polymers, surfactants and biomaterials (soft surfaces)
- Quantitative analysis of molecular adsorption, absorption and desorption processes as they happen
- Nearfield technique enables study of turbid and scattering systems without compromise
For full information on AnaLight® surface science instruments click on your product of choice below:
AnaLight®4D Workstation
AnaLight®4D
AnaLight® Nano200
AnaLight® NanoFlex
AnaLight® surface science instruments routinely and reproducibly provide quantitative data on real-time changes in dimension (resolution <0.1Å) and density (resolution <0.1 picogram/mm2) of immobilised and interacting thin films and nanosurfaces in the 0.1nm to 100nm range. This allows accurate calculation of further parameters including mass, surface coverage and concentration.